WebbThe ION TOF TOF-SIMS 5 Time-of-Flight Secondary Ion Mass Spectrometer (TOF-SIMS) is a highly sensitive surface analytical technique, using a pulsed and focused ion beam and time-of-flight analyzer to produce positive and negative mass spectra and mass spectral images from the outer 1 to 2nm of materials. It is capable of providing detailed … WebbPHI nanoTOF II PHI’s patented TRIFT mass spectrometer provides superior sensitivity, low spectral background, and the unique ability to image highly topographic surfaces. The nanoTOF II can be configured with a wide variety of options to optimize performance for organic materials, inorganic materials, or both, depending on customer requirements.
Time-of-Flight Secondary Ion Mass Spectrometry - Philips
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PHI nanoTOF II Time Flight SIMS - Spectra Research …
WebbNew TOF-SIMS instrument PHI nanoTOF 3 released! 2024.10.22 update PRODUCT New XPS instrument PHI VersaProbe 4 released! View ALL For starters in surface analysis: If you're wondering about surface analysis or how it can come in handy, click below. What is Surface? What is Surface Analysis? Topics What is XPS? What is AES? What is TOF-SIMS? Webb30 jan. 2024 · Rationale: This work presents the first surface analysis investigation of 2-phenylimidazole (PhI) as a corrosion inhibitor for brass in a 3 wt.% NaCl solution using time-of-flight secondary ion mass spectrometry (TOF-SIMS) and X-ray photoelectron spectroscopy (XPS). Webbdevis ou info gpus better than 1070